Storage Degradation Mechanism Analysis and Storage Life Prediction of the Optoelectronic Coupler Based on Multi-channel Degradation Testing Data

Article history: Received: 14.01.2014. Received in revised form: 01.03.2014. Accepted: 12.03.2014. Optoelectronic coupler, characterized by long life and high reliability, is one typical kind of optoelectronic devices. Accelerated degradation testing is mostly utilized to assess optoelectronic coupler storage life. However, in engineering, integrated optoelectronic coupler may be nagged with the fusion of multi-channel degradation data. To solve the problem, the paper firstly conducts accelerated storage degradation testing on a certain type optoelectronic coupler, and analyzes the main degradation model and mechanism of optoelectronic coupler under storage environment. Meanwhile, the paper gives an access to processing multi-channel degradation data based on pseudo life, which can be also employed to assess other integrated devices, like memories, with their accelerated degradation data.